Paper Titles

Impurity Concentration Mapping in Mulitcrystalline Silicon Wafers
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Single Contact Beam Induced Current Phenomena - A Review
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Challenging the Spatial Resolution Limits of CL and EBIC
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EBIC Investigation of a 3-Dimensional Network of Inversion Channels in Solar Cells on Silicon Ribbons
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Electrical Behaviour of Crystal Defects in Silicon Solar Cells
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LBIC Control Mapping of Textured Silicon Thin Film Obtained by Liquid Phase Epitaxy on Transferable Silicon Grid
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Beam Injection Studies of Dislocations and Oxygen Precipitates in Semiconductor Silicon
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Depth Profiling of the Recombination Activity of Defects Measured by Temperature-Dependent Cross-Sectional EBIC
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Simulation of EBIC Contrast for Extended Defects Inclined to the Surface
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HomeSolid State PhenomenaSolid State Phenomena Vols. 78-79Electrical Behaviour of Crystal Defects in Silicon...

Electrical Behaviour of Crystal Defects in Silicon Solar Cells

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Beam Injection Assessment of Microstructures in Semiconductors

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Periodical:

Solid State Phenomena (Volumes 78-79)

Pages:

39-48

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.78-79.39

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Online since:

April 2001

Authors:

Martin Kittler, Winfried Seifert, O. Krüger

Keywords:

Contamination, Defect, Dislocation, EBIC, Gettering, Hydrogenation, Multicrystalline Silicon, P-N Junction, Recombination, SiPHER®, Solar Cell

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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