Paper Titles

Challenging the Spatial Resolution Limits of CL and EBIC
p.19

EBIC Investigation of a 3-Dimensional Network of Inversion Channels in Solar Cells on Silicon Ribbons
p.29

Electrical Behaviour of Crystal Defects in Silicon Solar Cells
p.39

LBIC Control Mapping of Textured Silicon Thin Film Obtained by Liquid Phase Epitaxy on Transferable Silicon Grid
p.49

Beam Injection Studies of Dislocations and Oxygen Precipitates in Semiconductor Silicon
p.57

Depth Profiling of the Recombination Activity of Defects Measured by Temperature-Dependent Cross-Sectional EBIC
p.65

Simulation of EBIC Contrast for Extended Defects Inclined to the Surface
p.73

Reconstruction of Diffusion Length Distribution by the Modulated EBIC and OBIC
p.79

Cathodoluminescence Study of the Y₀ Emission from ZnSe Films
p.89

HomeSolid State PhenomenaSolid State Phenomena Vols. 78-79Beam Injection Studies of Dislocations and Oxygen...

Beam Injection Studies of Dislocations and Oxygen Precipitates in Semiconductor Silicon

Article Preview

Abstract:

You might also be interested in these eBooks

Beam Injection Assessment of Microstructures in Semiconductors

Info:

Periodical:

Solid State Phenomena (Volumes 78-79)

Pages:

57-64

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.78-79.57

Citation:

Cite this paper

Online since:

April 2001

Authors:

Sergio Pizzini, Simona Binetti, Alessia Le Donne, E. Leoni, Maurizio Acciarri, Giancarlo Salviati, L. Lazzarini

Keywords:

Cathodoluminescence, Dislocation, Oxygen Precipitates, Silicon

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2001 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: