Paper Titles

LBIC Control Mapping of Textured Silicon Thin Film Obtained by Liquid Phase Epitaxy on Transferable Silicon Grid
p.49

Beam Injection Studies of Dislocations and Oxygen Precipitates in Semiconductor Silicon
p.57

Depth Profiling of the Recombination Activity of Defects Measured by Temperature-Dependent Cross-Sectional EBIC
p.65

Simulation of EBIC Contrast for Extended Defects Inclined to the Surface
p.73

Reconstruction of Diffusion Length Distribution by the Modulated EBIC and OBIC
p.79

Cathodoluminescence Study of the Y₀ Emission from ZnSe Films
p.89

Recombination Properties of Defects in Gallium Nitride
p.95

Cathodoluminescence from Nanocrystals in Mechanically Milled Silicon
p.103

Highly Efficient CdS/CdTe Solar Cells Investigated by Cathodoluminescence Spectroscopy
p.111

HomeSolid State PhenomenaSolid State Phenomena Vols. 78-79Reconstruction of Diffusion Length Distribution by...

Reconstruction of Diffusion Length Distribution by the Modulated EBIC and OBIC

Article Preview

Abstract:

You might also be interested in these eBooks

Beam Injection Assessment of Microstructures in Semiconductors

Info:

Periodical:

Solid State Phenomena (Volumes 78-79)

Pages:

79-88

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.78-79.79

Citation:

Cite this paper

Online since:

April 2001

Authors:

Eugene B. Yakimov

Keywords:

Depletion Region, Diffusion Length, Electron Beam Induced Current (EBIC), Modulation, Semiconductor

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2001 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: