Influence of Ge Content on Electrical Properties: Sheet Resistance and Hall Mobility in Ion Beam Synthesized Si1-xGex Alloy

Abstract:

Article Preview

Info:

Periodical:

Solid State Phenomena (Volumes 82-84)

Edited by:

V. Raineri, F. Priolo, M. Kittler and H. Richter

Pages:

557-564

DOI:

10.4028/www.scientific.net/SSP.82-84.557

Citation:

C. Cerrina et al., "Influence of Ge Content on Electrical Properties: Sheet Resistance and Hall Mobility in Ion Beam Synthesized Si1-xGex Alloy", Solid State Phenomena, Vols. 82-84, pp. 557-564, 2002

Online since:

November 2001

Export:

Price:

$35.00

In order to see related information, you need to Login.