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HomeSolid State PhenomenaSolid State Phenomena Vol. 93Crystal Structure Analysis of Spherical Silicon...

Crystal Structure Analysis of Spherical Silicon Using X-Ray Pole Figures

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Polycrystalline Semiconductors VII

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Periodical:

Solid State Phenomena (Volume 93)

Pages:

249-256

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.93.249

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Online since:

June 2003

Authors:

S. Omae, C. Okamoto, H. Takakura, Y. Hamakawa, Mikio Murozono

Keywords:

Crystal Grain, Crystallinity, Pole Figure, Rocking Curve, Spherical Silicon

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© 2003 Trans Tech Publications Ltd. All Rights Reserved

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[1] D. M. Chapin, C. S. Fuller and G. L. Pearson, J. Appl. Phys. 25, 676 (1954).

[2] J. Zhao, A. Wang, M. Green, F. Ferrazza, Appl. Phys. Letters 73, 1991 (1998).

[3] J. D. Levine, G. B. Hotchkiss and M. D. Hammerbacher, in Proc. 22th IEEE Photovol. Spec. Conf. (Las Vegas, 1991), 1045z

[4] R. R. Schmit, W. J. Van Cak and E. S. Graf, in Proc. 12th Europ. Photovol. Solar Energy Conf, ed. By. R. Hill, W. Palz, P. Helm (H. S. Stephens & Associates, Bedford, UK, 1994), p.737.

[5] B. D. Cullity, Elements of X-Ray Diffraction (Addison-Wesley Publishing, Massachusetts, 1959), p.179.

[6] M. Schwartz, J. Appl. Phys. 26, 1507 (1955). Peak intensity (count) 1 3622.702 2 2921.149 3 3557.843 4 4796.100 5 606.958 6 1850.968 7 1325.995 500� m 1 2 3 4 5 6 7