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HomeSolid State PhenomenaSolid State Phenomena Vol. 93Behavior of Polysilicon Thin-Film Transistors at...

Behavior of Polysilicon Thin-Film Transistors at Different Temperatures

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Polycrystalline Semiconductors VII

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Periodical:

Solid State Phenomena (Volume 93)

Pages:

67-72

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.93.67

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Online since:

June 2003

Authors:

J.F. Llibre, H. Toutah, B. Tala-Ighil, B. Boudart, T. Mohammed-Brahim, O. Bonnaud

Keywords:

Material Quality, Polycrystalline Silicon, Reliability, Thin Film Transistor

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© 2003 Trans Tech Publications Ltd. All Rights Reserved

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