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HomeSolid State PhenomenaSolid State Phenomena Vol. 93Reliability of Low-Temperature Poly-Si Thin-Film...

Reliability of Low-Temperature Poly-Si Thin-Film Transistors

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Abstract:

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Polycrystalline Semiconductors VII

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Periodical:

Solid State Phenomena (Volume 93)

Pages:

43-48

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.93.43

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Online since:

June 2003

Authors:

Y. Inoue, H. Ogawa, Takeshi Endo, Hiroshi Yano, Tomoaki Hatayama, Yukiharu Uraoka, Takashi Fuyuki

Keywords:

Drain Avalanche, Dynamic Stress, Hot Carriers, Reliability, Thin Film Transistor

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© 2003 Trans Tech Publications Ltd. All Rights Reserved

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