Reliability of Low-Temperature Poly-Si Thin-Film Transistors

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Periodical:

Solid State Phenomena (Volume 93)

Edited by:

T. Fuyuki, T. Sameshima, H.P. Strunk and J.H. Werner

Pages:

43-48

DOI:

10.4028/www.scientific.net/SSP.93.43

Citation:

Y. Inoue et al., "Reliability of Low-Temperature Poly-Si Thin-Film Transistors", Solid State Phenomena, Vol. 93, pp. 43-48, 2003

Online since:

June 2003

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$35.00

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