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HomeSolid State PhenomenaSolid State Phenomena Vol. 93Polycrystalline Silicon Thin-Film Transistors...

Polycrystalline Silicon Thin-Film Transistors Fabricated by Defect Reduction Methods

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Polycrystalline Semiconductors VII

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Periodical:

Solid State Phenomena (Volume 93)

Pages:

37-42

DOI:

https://doi.org/10.4028/www.scientific.net/SSP.93.37

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Online since:

June 2003

Authors:

H. Watakabe, Mayumi Suzuki, Toshiyuki Sameshima

Keywords:

Carrier Mobility, Defect Passivation, Polycrystalline Silicon, Thin Film Transistor, Threshold Voltage

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© 2003 Trans Tech Publications Ltd. All Rights Reserved

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