Defects and Diffusion in Semiconductors
Defect and Diffusion Forum Volumes 183 - 185
doi:10.4028/www.scientific.net/DDF.183-185
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p189
Effect of Surface Proximity upon Point Defects in Silicon
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410 K
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Authors: V. Krishnamoorthy, M. Puga Lambers, Kevin S. Jones -
p199
Energetics of Extrinsic Defects in Si and their Role in Nonequilibrium Dopant Diffusion
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419 K
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Authors: Fuccio Cristiano, B. Colombeau, A. Claverie -
p207
Study of Diffusion and Defects by Medium-Energy Coaxial Impact-Collision Ion Scattering Spectroscopy
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410 K
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Authors: Takayuki Kobayashi, C.F. McConville, J. Nakamura, G. Dorenbos, H. Sone, T. Katayama, M. Aono -
p215
Transmission Electron Microscopic Study of Intersecting Stacking Faults in ZnSe/GaAs(001) Epilayers and (SiGe)/Si(001) Multilayers
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1 M
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Authors: K.K. Fung, Ning Wang -
p231
Analytical In-Diffusion Profiles of Dopants in Semiconductors
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398 K
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Authors: E. Antoncik
