Polycrystalline Semiconductors III
Solid State Phenomena Volumes 37 - 38
doi:10.4028/www.scientific.net/SSP.37-38
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p535
Polysilicon Technologies for Large Area Displays
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605 K
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Authors: N. Duhamel, B. Loisel
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p547
Thermal Stability of Glass Substrates During Solid Phase Crystallisation of a-Si on Glass by Rapid Thermal Annealing
[
254 K
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Authors: L. Plévert, L. Haji, M. Bonnel, N. Duhamel, B. Loisel
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p553
Polycrystalline Silicon Thin Film Transistors for Liquid Crystal Displays
[
657 K
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Authors: I Wei Wu
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p565
Performance of Poly-Si Thin Film Transistors Fabricated by Excimer-Laser Annealing of SiH4- and Si2H6- Source Low Pressure Vapor Deposited a-Si Films with or without Solid-Phase Crystallization
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299 K
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Authors: M. Fuse, I. Asai, M. Hirota, Yoshinari Miyamoto
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p571
Modelling and Optimisation of Poly-Si Thin Film Transistors for Flat Panel Displays
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286 K
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Authors: M. Kandouci, S. Mottet
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p577
Bulk and Interface States in Polycrystalline Silicon Thin Film Transistors
[
254 K
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Authors: C.A. Dimitriadis, D.H. Tassis, J. Stoemenos, N.A. Economou
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p583
Hot Carrier Induced Degradation in Polycrystalline Silicon Thin Film Transistors
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305 K
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Authors: G. Fortunato, G. Tallarida, A. Pecora
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p589
Influence of the Polysilicon Film Structure on the Capacitance Voltage Characteristics of Thin Film Transistors
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274 K
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Authors: Z. Benamara, S. Mansouri, H. Sehil, F. Raoult, O. Bonnaud
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p595
Photoconductivity Peculiarities in CdSe Field Transistor Layer
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267 K
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Authors: Juozas Vidmantis Vaitkus, J. Capon, V. Kazukauskas, R. Kiliulis, J. Storasta, J. Vanfleteren, A. Zindulis