Preparation of Sc2Mo3O12 and Characterization of its Negative Thermal Expansion Property

Jun Li; Xiao Nong Cheng; Jun Jun Zhu

doi:10.4028/www.scientific.net/AMM.320.181

Paper Titles

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Characterizing Dielectric Constant of Ceramics by Mie Resonance Theory
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Advance in the Growth of Ordered Ge/Si Quantum Dots
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Coulomb Effects in the Ge/Si Single Quantum Dot
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Preparation of Sc₂Mo₃O₁₂ and Characterization of its Negative Thermal Expansion Property
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Fabrication of Uniformly Growing Graphene Films via the Dip-Coating Method
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Pyroelectric Properties of SBN/BST by Powder-Sol Method
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Electrodeposition of ZnO Thin Films with Controllable Impurities and Microstructures
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Study on Microstructure and Ferroelectricity of Strontium Barium Titanate Thin Films Prepared by Sol-Gel Processing
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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vol. 320Preparation of Sc2Mo3O12 and Characterization of...

Preparation of Sc₂Mo₃O₁₂ and Characterization of its Negative Thermal Expansion Property

Abstract:

Negative thermal expansion (NTE) material Sc₂Mo₃O₁₂ was prepared by solid-state method. The phase structure, morphology and the thermal stability of the obtained products were examined by powder X-ray diffraction (XRD), scanning electron microscopy (SEM) and thermogravimetric-differential thermal analysis (TG-DSC), respectively. To study its negative thermal expansion property, two methods were utilized. One is based on the in-situ XRD results and the thermal expansion coefficient (CTE) was calculated by the cell parameters obtained at different temperatures. Another is based on the thermo-mechanical analysis (TMA) and the CTE was calculated by the length of Sc₂Mo₃O₁₂bar at different temperatures. The differences between these two methods were also discussed.