Optical and Surface Morphological Study of GaN Nanocolumn Grown on Gallium Coated Si by Molecular Beam Epitaxy

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Vertically aligned GaN nanocolumn arrays were grown by molecular beam epitaxy on Gallium coated silicon substrate. The dense packing of the NCs gives them the appearance of a continuous film in surface view, but cross-sectional analysis shows them to be isolated nanostructures. The GaN nanocolumns have uniform diameters of 85 nm, lengths up to 720 nm and possess a pyramid like tip. Photoluminescence measurements of NCs show excitonic emission with a dominant, narrow peak centered at 363 nm and FWHM of 68 meV. From the Raman spectrum, peaks at 566.9 and 730 cm-1 are assigned to the E2 and A1(LO) GaN phonons modes which clearly indicates that the grown nanocolumns are highly crystalline. The grown nanocolumns are highly oriented and perpendicular to the growth surface.

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Edited by:

S. J. CHUA, J. H. TENG, O. WADA, R. DE LA RUE and X. H. TANG

Pages:

120-122

Citation:

K. Santhakumar et al., "Optical and Surface Morphological Study of GaN Nanocolumn Grown on Gallium Coated Si by Molecular Beam Epitaxy", Advanced Materials Research, Vol. 31, pp. 120-122, 2008

Online since:

November 2007

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$38.00

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