The Research about the III-Nitride Compounds Epitaxially Grown on Si Substrate

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The III-nitride compounds epitaxially grown on Si substrate have attracted more and more attentions and some progress have been achieved. Many methods have been tried to tackle the issue which caused by the large lattice mismatch and thermal expansion coefficient mismatches between silicon substrate and the III-nitride compounds. This paper presents buffer layer technology, selective area and lateral epitaxial over growth technology, and presents the researches about the III-nitride devices. Semi polar and non-polar GaN films grown on Si (such as Si(110), Si(112), Si(001) et al.) also have been instructed. At the end of this paper, the development trend of epitaxial technology has been discussed.

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Advanced Materials Research (Volumes 399-401)

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935-944

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November 2011

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[1] S. Nakamura, G. Fasol, and S. J. Pearton, The Blue Laser Diode: The Complete Story,( 2nd ed. Springer, New York, 2000).

Google Scholar

[2] L. Liu and J. H. Edgar, Mater. Sci. Eng. R:Reports. Vol. 37, (2002)No.3, p.61

Google Scholar

[3] S. A. Kukushkin, A.V. Osipov, V. N. Bessolov, B. K. Medvedev, V. K.Nevolin, and K. A. Tcarik, Rev Adv. Mater. Sci. 17, (2008). 1-32

Google Scholar

[4] Alois Krost, Armin Dadgar, Materials Science and Engineering. B,Vol. 93 (2002),No.1-3, pp.77-84.

Google Scholar

[5] W.Rieger, T.Metzger, H.Angerer, R.Dimitrov, O. Ambacher, and M. Stutzmann. Appl. Phys. Lett., Vol.68, (1996), No.7, 970-972.

DOI: 10.1063/1.116115

Google Scholar

[6] G. Balakrishnan, S. Huang, L. Dawson, Y. Xin, P. Conlin, and D. Huffaker, [J] Appl. Phys. Lett. 86, (2005) No.3, pp.034105-034107

Google Scholar

[7] A. Fang, H. Park, O. Cohen, R. Jones, M. Paniccia, and J. Bowers, [J] Opt. Express Vol. 14, (2006) No.20, pp.9203-9210

Google Scholar

[8] C. W. Pei, B. Turk, W.Wang, T.S. Kuan, [J]. Appl. Phys. Vol.90, (2001) No.12, pp.5959-5962

Google Scholar

[9] M.J. Kappers, M.A. Moram, D.V. Sridhara Rao, C.McAleese, and C.J. Humphreys, [J] Journal of Cryst. Growth Vol. 312, (2010). No.3, pp.363-367

DOI: 10.1016/j.jcrysgro.2009.11.014

Google Scholar

[10] N. H. Zhang, X. L. Wang, Y. P. Zeng, H. L. Xiao, J. X. Wang, H. X. Liu, and J.M.Li,[J] Journal of Crystal Growth,Vol.280,(2005) No.3-4, pp.346-351

Google Scholar

[11] H. Ishikawa, G. Y. Zhao, N. Nakada, T. Egawa, T. Jimbo, and M. Umeno, [J] Japanese Journal of Applied Physics, Vol.38, (1999). No.5A, p. L492-L494

DOI: 10.1143/jjap.38.l492

Google Scholar

[12] S. Zamir, B. Meyler, and J. Salzman, [J] Appl. Phys. Lett. Vol.78,(2001) No.3, pp.288-290

Google Scholar

[13] Y. Honda, Y. Kuroiwa, M. Kawaguchi, and N. Sawaki,[J] Appl. Phys. Lett Vol.80, (2002). No. 2, pp.222-224

Google Scholar

[14] A. Dadgar, J. Bläsing, A. Diez, A. Alam, M. Heuken, and A. Krost,[J] Jpn J.Appl. Phys. Vol.39, Part 2 (2000). No.11B, p.L1183-1185

DOI: 10.1143/jjap.39.l1183

Google Scholar

[15] E. Feltin, S. Dalmasso, P. de Mierry, B. Beaumont, H. Lahreche, A Bouille´, H.Haas, M. Leroux, and P. Gibart, [J] Jpn. J. Appl. Phys, Vol.40 (2001). No.7B, p.L738-L740

DOI: 10.1143/jjap.40.l738

Google Scholar

[16] K. Cheng, M. Leys, S. Degroote, M. Germain, and G. Borghs, [J]Appl. Phys Lett. Vol.92, (2008).No.19, pp.192111-1—192111-3

Google Scholar

[17] A. Reiher , J. Bläsing , A. Dadgar , A. Diez and A. Krost.[J] .Journal of Crystal Growth,Vol.248 (2003), pp.563-567

DOI: 10.1016/s0022-0248(02)01880-8

Google Scholar

[18] P. Drechsel, H. Riechert [ J] Journal of crystal Growth Vol.315 (2011)No.1, pp.211-215

Google Scholar

[19] J.W. Lee, S.W. Park, J.B. Yoo. [J] Phys. Stat. Sol, Vol.176, (1999) No.1,pp.583-587.

Google Scholar

[20] H.Ishikawa, K. Yamamoto , T. Egawa, T. Soga, T.Jimbo, and M. Umeno. [J] Journal of Crystal Growth Vol. 189/190 (1998) 178-182

DOI: 10.1016/s0022-0248(98)00223-1

Google Scholar

[21] H. Ishikawa, G-Y. Zhao, N. Nakada, T. Egawa, T. Jimbo, and M. Umeno. [J]. Japanese Journal of Applied Physics, Vol.38, (1999) No. 5A, p. L492-L494.

DOI: 10.1143/jjap.38.l492

Google Scholar

[22] J W.Yang, C J Sun, Q Chen, M. Z. Anwar, and M. Asif Khan. [J] .Applied Physics Letters , Vol.69 (1996), No.23, pp.3566-3568.

Google Scholar

[23] A. Dadgar,M. Poschenrieder, J. Bläsing, K. Fehse, A. Diez, and A. Krost [J]Appl. Phys. Lett.Vol. 80, (2002) No.20, pp.3670-3672

DOI: 10.1063/1.1479455

Google Scholar

[24] P. Kumar, L. Nair, S. Bera, B. R. Mehta, and S. M. Shivaprasad, [J].Appl.Surf. Sci. Vol.255, (2009).No.15, p.6802

Google Scholar

[25] T. Takeuchi, H. Amano, K. Hiramatsu, N. Sawaki, and I. Akasaki, [J].Journal of Crystal. Growth, Vol.115, (1991)No.1-4, pp.634-638

DOI: 10.1016/0022-0248(91)90817-o

Google Scholar

[26] A. Watanabe, T. Takeuchi, K. Hirosawa, H. Amano, K. Hiramatsu, and I. Akasaki,[J] J. Cryst. Growth Vol.128, (1993).No.1-4, p.391

Google Scholar

[27] Y. Nakada, L. Aksenov, and H. Okumura,[J] Appl. Phys. Lett. Vol.73, (1998). No.6, pp.827-829

Google Scholar

[28] Haoxiang Zhang, Zhizhen Ye, and Binghui Zhao [J] Journal of Applied Physics,Vol. 87, (2000) No. 6, pp.2830-2834

Google Scholar

[29] F.R.Hu, R.Ito, Y.Zhao, Y.Kanamori, K.Hane, Optical MEMS and Their Applications Conference, 2006. IEEE/LEOS International Conference on pp.27-28

Google Scholar

[30] Z-Y Li, S-M Lan,W-Y Uen,Y-R Chen, M-C Chen, Y-H Huang, C-T Ku, S-M Liao, T-N Yang, S-C Wang, and G-C Chi. [J], J. Vac. Sci. Technol. Vol.26, (2008) NO.4, pp.587-591

Google Scholar

[31] P. Kumar, J. Kuyyalil, and S. M. Shivaprasad, [J],Appl. Phys. Lett Vol.97, (2010) No.22, pp.221913-1——221913-3

Google Scholar

[32] B. D. Joyce and J. A. Bradley, Nature (London) Vol.195, (1962) 458

Google Scholar

[33] G. Zimmermann, A. Ougazzaden, A. Gloukhian, E.V.K. Rao, D. Delprat, A. Ramdane, A. Mircea.[J], Journal of Crystal Growth Vol. 170 (1997) No.1-4, pp.645-649

DOI: 10.1016/s0022-0248(97)80021-8

Google Scholar

[34] G-T Chen, C-H Chan, C-H Hou, H-H Liu N-W Shiu,M-N Chang, C-C Chen and J-I Chyi,[J], Proc. of Spie Vol. 6894 (2008) 689408-1——689408-6

Google Scholar

[35] Y. Wang, F.Hu and K. Hane. [J] Semiconductor Science and Technology Vol.26 (2011)No.4, p.045015(1-6)

Google Scholar

[36] Z. Li, J. Wu, Z M.Wang, D .Fan, A .Guo, S. Li, S-Q Yu, O. Manasreh and G J .Salamo [J] Nanoscale Res. Lett.Vol.5, (2010),No.6, pp.1079-1084

DOI: 10.1007/s11671-010-9605-2

Google Scholar

[37] J .Wu, D .Shao, V G .Dorogan, A Z .Li, S .Li, E A .DeCuir, Jr, M O Manasreh, Z M .Wang, Y. I Mazur and G. J Salamo. [J] Nano Lett.Vol.10 (2010)No.4, pp.1512-1516

DOI: 10.1021/nl100217k

Google Scholar

[38] V. V. Kuryatkov, W. Feng, M. Pandikunta, J. H. Woo, D. Garcia,H. R. Harris, S. A. Nikishin, and M. Holtz1,[J] Appl. Phys. Lett Vol. 96, (2010) No.7, pp.073107-1--073107-3

DOI: 10.1063/1.3310279

Google Scholar

[39] O. Moshe, D. H. Rich, B. Damilano, and J. Massies [J] Appl. Phys. Lett. Vol.98, (2011),No.6, pp.061903-1——061903-3

Google Scholar

[40] Maria Tchernycheva, François H. Juliena, and Eva Monroy, [J],Proc. of SpiE Vol. 7602 (2010) 76021A-1—76021A-12

Google Scholar

[41] A.Mills, [J] III-Vs Review Vol.19(2006) No.3, pp.35-39.

Google Scholar

[42] B. Hahn, A. Weima, M. Peter, J. Baur, [J] Proc. of SPIE Vol. 6910, (2008) 691004(1-8)

Google Scholar

[43] D.Zhu, C.McAleese,M.Häberlen, C.Salcianu,T.Thrush,M. Kappers, A.Phillips, P.Lane, M.Kane, D.Wallis, T.Martin, M.Astles, N.Hylton, P.Dawson, and C.Humphreys. [J] J.Appl.Phys.Vol.109,(2011), No.1, pp.014502-1—014502-6

DOI: 10.1063/1.3530602

Google Scholar

[44] T. Egawa, B. Zhang, and H. Ishikawa. [J] IEEE Electron Device Letters, VOL. 26, (2005), NO. 3,pp.169-171

Google Scholar

[45] K.Orita, Y.Fukushima, M.Usuda, S.Takigawa, T. Tanaka. [J] IEEE Journal of Quantum Electonnics, VOL.44, ( 2008) NO. 10, pp.984-989

Google Scholar

[46] M. A. Mastro,R. T. Holm, N. D. Bassim, D. K. Gaskill, J. C. Culbertson, M. Fatemi,C. R. Eddy, Jr., R. L. Henry, and M. E. Twigg. [J] J. Vac. Sci. Technol. Vol. 24 (2006) No.4, pp.1631-1634

Google Scholar

[47] Y. H. Zhou, Y. W. Tang, J. P. Rao, F.Y. Jiang.[J]. ACTA Optica Sinica, Vol. 29, (2009) No. 1, pp.252-255(in Chinese)

Google Scholar

[48] M. K. Kelly, O. Ambacher, B. Dahlheimer, G. Groos, R. Dimitrov, H. Angerer, and M. Stutzmann .[J]. Appl. Phys. Lett., Vol. 69, (1996) No. 12, pp.1749-1751

DOI: 10.1063/1.117473

Google Scholar

[49] Ting Wang Xia Guo Yuan Fang Bin Liu and Guangdi Shen, [J].Chinese Optics Letters Vol. 4, (2006) No. 7, pp.416-418

Google Scholar

[50] J-H. Hu, J.-S. Zhu, Y.-C. Feng, J.-B. Zhang, Z.-H. Li,B.-P. Guo, and X.-S. Xu, Chin.[J], J. Luminescence (inChinese) Vol.26, (2005) 518

Google Scholar

[51] C. Kisielowski, J. Krüger, S. Ruvimov, T. Suski, J. W.Ager III, E. Jones, Z. Liliental-Weber, M. Rubin, E. R.Weber, M. D. Bremser, and R. F. Davis,[J] Phys. Rev. B, Vol.54, (1996) No.24, p.17745–17753

DOI: 10.1103/physrevb.54.17745

Google Scholar

[52] Ting Wang, Zhanzhong Cui, Lixin Xu, The Ninth International Conference on Electronic Measurement & Instruments (2009,Beijing) 2-222——2-225

Google Scholar

[53] E.Alarcón-Lladó, S.Bin-Dolmanan,V. K. X. Lin,S. L.Teo,A.Dadgar,A. Krost,and S. Tripathy ,[J], J. Appl. Phys Vol.108, (2010) No.11, pp.114501-1—— 114501-5

DOI: 10.1063/1.3505780

Google Scholar

[54] K. M. Wong, X. B. Zou, P. Chen, and K. M. Lau, [J],IEEE Electron Device Lett. Vol.31, (2010) No.2, pp.132-134

Google Scholar

[55] U.Rossner, A.Barski, J. L. Rouviere, A.Bourret, J.Massies, C.Deparis, N.Grandjean,[J],Materials Science and EngineeringB Vol.29, (1995), No.1-3, pp.74-77

Google Scholar

[56] P.R. Willmott, F.Antoni, [J] Appl. Phys.Lett.Vol.73.(1998) No.10, pp.1394-1396

Google Scholar

[57] J.H. Boo, S-B.Lee, Y.S. Kim, J.T. Park, K.S.Yu,Y.Kim, Phys, Stat,sol.(a), Vol. 176, (1999) ,711-717

Google Scholar

[58] L.Wang X.Liu,Y.Zan,J.wang,D.wang,D.Lu,Z.Wang,[J] Appl.Phys.Lett.Vol.72, (1998),No.1, pp.109-111

Google Scholar

[59] N. Sawaki, Y.Honda, T.Hikosak, S.Tanaka, M.Yamaguchi, N.Koide, and K.Tomita [J] Proc. of Spie Vol. 7602 (2010) pp.760203-1——760203-9

Google Scholar

[60] N.Sawaki, Y. Honda [J] Science China Technological Sciences Vol.54( 2011) No.1, p.38–41

Google Scholar

[61] Z. H. Wu, T. Tanikawa, T. Murase, Y-Y. Fang, C. Q. Chen, Y. Honda,M. Yamaguchi, H.Amano,and N. Sawaki [J] Appl.Phys.Lett,Vol. 98, (2011)No.5, pp.051902-1——051902-3

Google Scholar

[62] X. Ni, M. Wu, J. Lee, X. Li, A. A. Baski, Ü. Özgür, and H. Morkoç [J] Appl.Phys.Lett, Vol.95, (2009)No.11, p.111102(1-3)

Google Scholar

[63] X. Ni, J. Lee, M. Wu, X. Li, R. Shimada, Ü. Özgür, A. A. Baski, H. Morkoc, T. Paskova, G. Mulholland, and K. R. Evans [J] Appl. Phys. Lett. Vol.95, (2009) No.10, p.101106(1-3)

Google Scholar

[64] I W. Feng, X. K. Cao, J. Li, J. Y. Lin, H. X. Jiang, N. Sawaki,Y. Honda, T. Tanikawa, and J. M. Zavada [J] Appl. Phys. Lett Vol. 98,(2011) No.8, pp.081102-1——081102-3

Google Scholar

[65] T. Tanikawa, D. Rudolph , T. Hikosaka , Y. Honda, M. Yamaguchi, N. Sawaki [J]. Journal of Crystal Growth, Vol. 310 (2008) No.23, p.4999–5002

DOI: 10.1016/j.jcrysgro.2008.08.059

Google Scholar

[66] Y.Honda, N.Kameshiro, M .Yamaguchi, i, N. Sawaki [J] Journal of Crystal Growth, Vol. 242 ,(2002)No.1-2, p.82–86

Google Scholar

[67] K. Tomita, T. Hikosaka, T. Kachi, and N. Sawaki, [J] Journal of Cryst. Growth 311, (2009),No.10, pp.2883-2886

Google Scholar

[68] T. Tanikawa, T. Hikosaka, Y. Honda, M. Yamaguchi, N. Sawaki [J] Physica Status Solidi (c),Vol.5 (2008), No.9, p.2966–2968

DOI: 10.1002/pssc.200779236

Google Scholar

[69] T. Tanikawa, Y. Kagohashi, Y. Honda, M. Yamaguchi, and N. Sawaki, [J] Journal of Cryst. Growth 311, (2009) No.10, pp.2879-2882

DOI: 10.1016/j.jcrysgro.2009.01.109

Google Scholar

[70] N. Sawaki, T. Hikosaka, N. Koide, S. Tanaka, Y. Honda, and M. Yamaguchi,[J] Journal. of Cryst. Growth 311, (2009) No.10, pp.2867-2874

DOI: 10.1016/j.jcrysgro.2009.01.032

Google Scholar

[71] A. Dadgar, F. Schulze1, M. Wienecke1, A .Gadanecz1,J .Bläsing, P. Veit, T. Hempel, A .Diez,J.Christen1 and A Krost.[J] New Journal of Physics Vol.9 (2007) p.389

Google Scholar

[72] S. Davies,T. S. Huang, M. H. Gass, A. J. Papworth, T. B. Joyce, and P. R. Chalke.[J]. Appl. Phys. Lett, Vol.84(2004) No.14, pp.2566-2568

Google Scholar

[73] H. Morkoç, Handbook of Nitride Semiconductors and Devices (Wiley, Berlin, 2008), Vol. 3.

Google Scholar