On the Role of Bulk Recombination of Intrinsic Point Defects in Si and their Interaction with the Surface in the Course of {113} Defect Growth: a Kinetic Study by in situ HVEM Irradiation

Article Preview

Abstract:

You might also be interested in these eBooks

Info:

Periodical:

Defect and Diffusion Forum (Volumes 210-212)

Pages:

21-36

Citation:

Online since:

November 2002

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2002 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation: