Defect States in InAs Quantum Dots Characterized by Photo-Induced Current Transient Spectroscopy

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Periodical:

Defect and Diffusion Forum (Volumes 210-212)

Edited by:

D.J. Fisher

Pages:

81-88

DOI:

10.4028/www.scientific.net/DDF.210-212.81

Citation:

H. Y. Cho "Defect States in InAs Quantum Dots Characterized by Photo-Induced Current Transient Spectroscopy", Defect and Diffusion Forum, Vols. 210-212, pp. 81-88, 2002

Online since:

November 2002

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