Engineering Research
Materials Science
Engineering Series
Defect and Diffusion Forum
Volumes
The 34 papers are grouped as follows:
Chapter 1: Reactions and Interdiffusion in Binary and Multicomponent Systems;
Chapter 2: Ion Transport;
Chapter 3: Defects, Stresses and Relaxation;
Chapter 4: Short-Circuit Diffusion;
Chapter 5: Diffusion Phenomena under Strong Gravitation;
Chapter 6: Diffusion-Related Phenomena;
Chapter 7: Advanced Methods of Diffusion Measurement
The Monte Carlo method, largely the brainchild of Stanislaw Ulam and first implemented by John von Neumann, depends upon the use of digital computers and is therefore very much a product of post-WW2 technological developments; even though one could argue that the Buffon’s Needle estimate was an ancestor of the technique. The probabilistic nature of the method makes it a good choice for modeling those physical phenomena which involve similarly random motions at the atomic scale; a particularly good example being that of mass diffusion. The present volume comprises a compilation of selected Monte Carlo studies of diffusion in borides, carbides, diamond, graphene, graphite, hydrides, ice, metals, oxides, semiconductors, sulfides, zeolites and other materials. General aspects of diffusion are also covered. The 516 entries cover the period from 1966 to 2014.
This topical volume on Advanced Diffusion Processes and Phenomena addresses diffusion in a wider sense of not only mass diffusion but also heat diffusion in fluids and solids. Both diffusion phenomena play an important role in the characterization of engineering materials and corresponding structures. Understanding these different transport phenomena at many levels, from atomistic to macro, has therefore long attracted the attention of many researchers in materials science and engineering and related disciplines. The present topical volume captures a representative cross-section of some of the recent advances in the area of mass and heat transport. Reflecting the enormous breadth of the area, the range of topics covered is accordingly very large.