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HomeJournal of Nano ResearchJournal of Nano Research Vol. 39Photoelectric Phenomena and Photoelectric...

Photoelectric Phenomena and Photoelectric Characterization Methods of the MOS System - Basics and New Developments

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Abstract:

In this article photoelectric phenomena taking place in the MOS system will be discussed and the classical theory of these phenomena will be presented. This will be followed by pointing out some shortcomings of this theory and presentation of our contributions which eliminate these shortcomings and allow development of new MOS system characterization methods.

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Journal of Nano Research Vol. 39

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Periodical:

Journal of Nano Research (Volume 39)

Pages:

69-79

DOI:

https://doi.org/10.4028/www.scientific.net/JNanoR.39.69

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Online since:

February 2016

Authors:

Henryk M. Przewlocki*

Keywords:

Characterization Methods, MOS System, Photoelectric Phenomena

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© 2016 Trans Tech Publications Ltd. All Rights Reserved

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* - Corresponding Author

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