[1]
K. K. Likharev: Proc. IEEE, 87, (1999) 606.
Google Scholar
[2]
C. Wasshuber, H. Kosina, and S. Selberherr: IEEE Trans. Electron Devices, ED-45, (1998) 2365.
DOI: 10.1109/16.726659
Google Scholar
[3]
Y. Takahashi, Y. Ono, A. Fujiwara and H. Inokawa: J. Phys. Condensed Matter, 14, (2002) R995.
DOI: 10.1088/0953-8984/14/39/201
Google Scholar
[4]
Y. Ono, A. Fujiwara, K. Nishiguchi, H. Inokawa, and Y. Takahashi: J. Appl. Phys., 97, (2005) 031101.
Google Scholar
[5]
Y. Takahashi, A. Fujiwara, K. Yamazaki, H. Namatsu, K. Kurihara, and K. Murase: Appl. Phys. Lett., 77, (2000) 637.
Google Scholar
[6]
Y. Ono, Y. Takahashi, K. Yamazaki, M. Nagase, H. Namatsu, K. Kurihara, and K. Murase: Appl. Phys. Lett., 76, (2000) 3121.
DOI: 10.1063/1.126543
Google Scholar
[7]
H. Inokawa, A. Fujiwara, and Y. Takahashi: Appl. Phys. Lett., 79, (2001) 3618.
Google Scholar
[8]
H. Inokawa, A. Fujiwara, and Y. Takahashi: IEEE Trans. of Electron Devices, 50, (2003) 462.
Google Scholar
[9]
K. Degawa, T. Aoki, T. Higuchi, H. Inokawa and Y. Takahashi: IEICE Trans. Electron, E87-C, (2004) 1827.
Google Scholar
[10]
W. G. van der Wiel, S. De Franceschi, J. M. Elzerman, T. Fujisawa, S. Tarucha, and L. P. Kouwenhoven: Rev. Mod. Phys. 75 (2003) 1.
DOI: 10.1103/revmodphys.75.1
Google Scholar
[11]
T. Hayashi, T. Fujisawa, H. D. Cheong, Y. H. Jeong, and Y. Hirayama: Phys. Rev. Lett. 91 (2003) 226804.
Google Scholar
[12]
J. Gorman, D. G. Hasko, and D. A. Williams: Phys. Rev. Lett. 95 (2005) 090502.
Google Scholar
[13]
Y. Takahashi, M. Nagase, H. Namatsu, K. Kurihara, K. Iwadate, Y. Nakajima, S. Horiguchi, K. Murase, and M. Tabe: Electronics Lett., 31, (1995) 136.
DOI: 10.1049/el:19950082
Google Scholar
[14]
S. Horiguchi, M. Nagase, K. Shiraishi, H. Kageshima, Y. Takahashi, and K. Murase: Jpn J. Appl. Phys., 40, (2001) L29.
DOI: 10.1143/jjap.40.l29
Google Scholar
[15]
M. Jo, T. Kaizawa, M. Arita, A. Fujiwara, Y. Ono, H. Inokawa, J. -B. Choi, and Y. Takahashi: Thin Solid Films, 518, (2010) S186.
DOI: 10.1016/j.tsf.2009.10.085
Google Scholar
[16]
T. Kaizawa, T. Oya, M. Arita, Y. Takahashi, and J. -B. Choi: Jpn. J. of Appl. Phys., 45, (2006) 5317.
Google Scholar
[17]
T. Kaizawa, M. Arita, A. Fujiwara, K. Yamazaki, Y. Ono, H. Inokawa, Y. Takahashi, and J. -B. Choi: IEEE Trans. Nanotechnology, 8, (2009) 535.
DOI: 10.1109/tnano.2009.2016338
Google Scholar
[18]
T. Kaizawa, M. Jo, M. Arita, A. Fujiwara, K. Yamazaki, Y. Ono, H. Inokawa, Y. Takahashi, and J. -B. Choi: Inter. J. Nanotechnology and Molecular Computation, 1, (2009) 58.
DOI: 10.4018/jnmc.2009040104
Google Scholar
[19]
N. Kuwamura, K. Taniguchi and C. Hamaguchi, Electron. Communi. Jpn. Part 2, 77 (1994) 65.
Google Scholar
[20]
M. Jo, T. Kaizawa, M. Arita, A. Fujiwara, K. Yamazaki, Y. Ono, H. Inokawa, Y. Takahashi, and J. -B. Choi: Materials Science in Semiconductor Processing, 11, (2008) 175.
DOI: 10.1016/j.mssp.2008.12.001
Google Scholar
[21]
Y. Ono, H. Inokawa and Y. Takahashi: IEEE Transactions Nanotechnology, 1, (2002) 93.
Google Scholar
[22]
K. Nishiguchi, A. Fujiwara, Y. Ono, H. Inokawa, and Y. Takahashi: Appl. Phys. Lett. s, 88, (2006) 183101.
Google Scholar
[23]
H. Inokawa, A. Fujiwara, and Y. Takahashi: Jpn J. Appl. Phys., 41, (2002) 2566.
Google Scholar