Paper Title:
First-Principles Calculations of the Dielectric Constant for the GeO2 Films
  Abstract

Dielectric properties of α-quartz and rutile-GeO2 thin-films are investigated using first-principles ground-state calculations in external electric fields. The optical and the static dielectric constants inside the films have nearly-constant values, corresponding to their bulk values, while only at the topmost surface layer the dielectric constants decrease distinctly. It has been found that the dielectric constant for the rutile-GeO2 is larger than that for the α-quartz one, which stems from the larger ionic character of the Ge-O bond for the rutile phase.

  Info
Periodical
Edited by
Seiichi Miyazaki and Hitoshi Tabata
Pages
60-65
DOI
10.4028/www.scientific.net/KEM.470.60
Citation
M. Tamura, J. Nakamura, A. Natori, "First-Principles Calculations of the Dielectric Constant for the GeO2 Films", Key Engineering Materials, Vol. 470, pp. 60-65, 2011
Online since
February 2011
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$35.00
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