First-Principles Calculations of the Dielectric Constant for the GeO2 Films

Abstract:

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Dielectric properties of α-quartz and rutile-GeO2 thin-films are investigated using first-principles ground-state calculations in external electric fields. The optical and the static dielectric constants inside the films have nearly-constant values, corresponding to their bulk values, while only at the topmost surface layer the dielectric constants decrease distinctly. It has been found that the dielectric constant for the rutile-GeO2 is larger than that for the α-quartz one, which stems from the larger ionic character of the Ge-O bond for the rutile phase.

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Periodical:

Edited by:

Seiichi Miyazaki and Hitoshi Tabata

Pages:

60-65

DOI:

10.4028/www.scientific.net/KEM.470.60

Citation:

M. Tamura et al., "First-Principles Calculations of the Dielectric Constant for the GeO2 Films", Key Engineering Materials, Vol. 470, pp. 60-65, 2011

Online since:

February 2011

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$35.00

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