AFM Characterization of the Nanoparticles Arrangement by Electrophoretic Deposition

J.A. Escribano; Isabel Gonzalo-Juan; Antonio Javier Sanchez-Herencia; Begoña Ferrari

doi:10.4028/www.scientific.net/KEM.507.61

Paper Titles

Electrophoretic Deposition onto Ionic Liquid Layers
p.35

AC Electrophoresis, a New Technique for Deposition of Ceramic Nanoparticles; Introduction, Application and Mechanism
p.41

Direct Numerical Simulations of Electrophoretic Deposition of Charged Colloidal Suspensions
p.47

Fundamentals of Pulsed and Direct Current Electrophoretic Infiltration Kinetics
p.53

AFM Characterization of the Nanoparticles Arrangement by Electrophoretic Deposition
p.61

High Voltage Electrophoretic Deposition of Aligned Nanoforests for Scalable Nanomanufacturing of Electrochemical Energy Storage Devices
p.67

Thin Films of Europium (III) Doped-TiO₂ Prepared by Electrophoretic Deposition from Nanoparticulate Sols
p.73

Current Measurements as a Direct Diagnostic for Sub-Monolayer Growth of Nanoparticle Films in Non-Polar Electrophoretic Deposition
p.79

A Controlled Colloidal Destabilization Approach for the Electrophoretic Deposition (EPD) from Cobalt Ferrite and Magnetite Nanoparticles Suspensions in Diethylene Glycol
p.85

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AFM Characterization of the Nanoparticles Arrangement by Electrophoretic Deposition

Abstract:

In this study, coatings with irregular nanotopography prepared by electrophoretic deposition (EPD) in electro-polished surfaces are characterized. Films are composed by Yttria Stabilized Zirconia (YSZ) particles, 5-8 nm in size and spherical morphology, synthesized under hydrothermal conditions and re-dispersed in the post reaction medium. Growth behaviour of coatings with time, including array morphology, aggregation origin and activity, are explored by means of atomic force microscopy (AFM) and its different measurement modes. Arrangement of electrically driven particles at the nanoscale can be assessed through the topographic description of films prepared with increasing deposition times. Moreover, topography can be associated to the electrokinetic behaviour of particles and agglomeration degree of the suspension. The evaluation of particle junctions and then the quality of particle cohesion within the film can also be discerned by AFM characterization.