Measurement of Coercive Force Enhanced by Nanometer-Sizing of Magnetic Dot by X-Ray Magnetic Circular Dichroism (XMCD)

Sumio Hosaka; Zulfakri bin Mohamad; You Yin; Hiroshi Sakurai; Yuji Kondo; Jun Ariake; Naoki Honda; Motohiro Suzuki

doi:10.4028/www.scientific.net/KEM.534.122

Paper Titles

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Fabrication of 30-nm-Pitched CoPt Magnetic Dot Arrays Using 30-keV-Electron Beam Lithography and Ion Milling for Patterned Media
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Measurement of Coercive Force Enhanced by Nanometer-Sizing of Magnetic Dot by X-Ray Magnetic Circular Dichroism (XMCD)
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HomeKey Engineering MaterialsKey Engineering Materials Vol. 534Measurement of Coercive Force Enhanced by...

Measurement of Coercive Force Enhanced by Nanometer-Sizing of Magnetic Dot by X-Ray Magnetic Circular Dichroism (XMCD)

Abstract:

We have studied the coercive force of fine magnetic CoPt dot enhanced by nanometer-sizing of the dot. The 39-to 106-nm-sized CoPt magnetic dot arrays were formed by30-keV-electron beam (EB) drawing with thin calixarene resist and 200-eV-Ar ion milling. Using the fine magnetic dot arrays, we measured coercive forces of the dot by x-ray magnetic circular dichroism (XMCD) with an energy of 11.56 keV, which corresponds to an energy edge of Pt-L3. It is experimentally demonstrated that a coercive force of the nanometer-sized magnetic column increased as the dot diameter decreased. Keywords: Coercive force, nanomagnetic column, XMCD, magnetic storage, EB lithography

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Key Engineering Materials (Volume 534)

Pages:

122-125

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.534.122

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January 2013

Authors:

Sumio Hosaka, Zulfakri bin Mohamad, You Yin, Hiroshi Sakurai, Yuji Kondo, Jun Ariake, Naoki Honda, Motohiro Suzuki

Keywords:

Coercive Force, EB Lithography, Magnetic Storage, Nanomagnetic Column, XMCD

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