Structural Defects in Ion-Implanted Silicon Observed by Perturbed Angular Correlation

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Periodical:

Materials Science Forum (Volumes 10-12)

Edited by:

H.J. von Bardeleben

Pages:

1141-1146

DOI:

10.4028/www.scientific.net/MSF.10-12.1141

Citation:

M. Deicher et al., "Structural Defects in Ion-Implanted Silicon Observed by Perturbed Angular Correlation", Materials Science Forum, Vols. 10-12, pp. 1141-1146, 1986

Online since:

January 1986

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$35.00

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