Critical Thickness Determination of II-VI Semiconductors by Rheed and X-Ray Diffraction

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Periodical:

Materials Science Forum (Volumes 182-184)

Edited by:

H. Heinrich and J.B. Mullin

Pages:

147-150

DOI:

10.4028/www.scientific.net/MSF.182-184.147

Citation:

D. Reisinger et al., "Critical Thickness Determination of II-VI Semiconductors by Rheed and X-Ray Diffraction", Materials Science Forum, Vols. 182-184, pp. 147-150, 1995

Online since:

February 1995

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$35.00

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