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HomeMaterials Science ForumMaterials Science Forum Vols. 196-201Influence of Intrinsic Defects on the Electronic...

Influence of Intrinsic Defects on the Electronic Structure of Non-Stoichiometric CuInS₂ Chalcopyrite Semiconductors

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Defects in Semiconductors 18

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Periodical:

Materials Science Forum (Volumes 196-201)

Pages:

1667-1672

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.196-201.1667

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Online since:

November 1995

Authors:

Tetsuya Yamamoto, Hiroshi Katayama-Yoshida

Keywords:

Band-Structure, Chalcopyrite, CuInSe₂, Dangling Bond, Hybridisation, Intrinsic Defect, Non-Stoichiometry, Ordered Vacancy Structure

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© 1995 Trans Tech Publications Ltd. All Rights Reserved

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