Defects in Porous Silicon: A Study with Optical and Spin Resonance Methodes

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 196-201)

Edited by:

M. Suezawa and H. Katayama-Yoshida

Pages:

1673-1678

DOI:

10.4028/www.scientific.net/MSF.196-201.1673

Citation:

D.M. Hofmann et al., "Defects in Porous Silicon: A Study with Optical and Spin Resonance Methodes", Materials Science Forum, Vols. 196-201, pp. 1673-1678, 1995

Online since:

November 1995

Export:

Price:

$35.00

In order to see related information, you need to Login.