Defects in Porous Silicon: A Study with Optical and Spin Resonance Methodes

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Periodical:

Materials Science Forum (Volumes 196-201)

Edited by:

M. Suezawa and H. Katayama-Yoshida

Pages:

1673-1678

Citation:

D.M. Hofmann et al., "Defects in Porous Silicon: A Study with Optical and Spin Resonance Methodes", Materials Science Forum, Vols. 196-201, pp. 1673-1678, 1995

Online since:

November 1995

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