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HomeMaterials Science ForumMaterials Science Forum Vols. 258-263Influence of Fabrication Conditions on Properties...

Influence of Fabrication Conditions on Properties of Si:Er Light-Emitting Structures

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Defects in Semiconductors 19

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Periodical:

Materials Science Forum (Volumes 258-263)

Pages:

1527-1532

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.258-263.1527

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Online since:

December 1997

Authors:

N.A. Sobolev, A.M. Emel'yanov, Yu.A. Nikolaev, K.F. Shtel'makh, Yu.A. Kudryavtsev, V.I. Sakharov, I.T. Serenkov, M.I. Makovijchuk, E.O. Parshin

Keywords:

Defect, Erbium, Luminescence, Silicon

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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