Study of Hole Traps in p-Type ZnSe and ZnSSe Epilayers by DLTS and Admittance Spectroscopy

Abstract:

Article Preview

Info:

Periodical:

Materials Science Forum (Volumes 258-263)

Edited by:

Gordon Davies and Maria Helena Nazaré

Pages:

1671-1676

DOI:

10.4028/www.scientific.net/MSF.258-263.1671

Citation:

I.S. Hauksson et al., "Study of Hole Traps in p-Type ZnSe and ZnSSe Epilayers by DLTS and Admittance Spectroscopy", Materials Science Forum, Vols. 258-263, pp. 1671-1676, 1997

Online since:

December 1997

Export:

Price:

$35.00

In order to see related information, you need to Login.