Metastable Defects and Recombination in Hydrogenated Amorphous Silicon
p.331
p.331
Tracing Diffusion by Laplace Deep-Level Spectroscopy
p.337
p.337
Defects in AS-Grown Silicon and their Evolution During Heat Treatments
p.341
p.341
An Investigation of the Possibility that Oxygen Diffusion in Czochralski Silicon is Catalyzed during Clustering
p.347
p.347
Temperature-Dependent Widths of Infrared and Far-Infrared Absorption Lines of Oxygen in Silicon
p.355
p.355
The Oxygen Dimer in Silicon: Some Experimental Observations
p.361
p.361
Formation of Oxygen Dimers in Silicon during Electron-Irradiation Above 250 °C
p.367
p.367
High-Field EPR Spectroscopy of Thermal Donors in Silicon
p.373
p.373
Shallow Thermal Donors in Annealed CZ Silicon and Links to the NL10 EPR Spectrum: The Relevance of H, Al and N Impurities
p.379
p.379
Temperature-Dependent Widths of Infrared and Far-Infrared Absorption Lines of Oxygen in Silicon
Abstract:
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Periodical:
Materials Science Forum (Volumes 258-263)
Pages:
355-360
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Online since:
December 1997
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© 1997 Trans Tech Publications Ltd. All Rights Reserved
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