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HomeMaterials Science ForumMaterials Science Forum Vols. 258-263Frenkel Pairs and Impurity-Defect Interactions in...

Frenkel Pairs and Impurity-Defect Interactions in p-Type Silicon Irradiated with Fast Electrons and Gamma-Rays at Low Temperatures

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Defects in Semiconductors 19

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Periodical:

Materials Science Forum (Volumes 258-263)

Pages:

575-580

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.258-263.575

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Online since:

December 1997

Authors:

Valentin V. Emtsev, U. Dedek, Peter Ehrhart, P.D. Kervalishvili, M.A. Margaryan, D.S. Poloskin, Holger Zillgen

Keywords:

Electrical Measurements, Irradiation, Shallow Acceptors, Silicon

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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