Performance Degradation of Microcrystalline Silicon-Based p-i-n Detectors Upon He4 Irradiation

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Periodical:

Materials Science Forum (Volumes 258-263)

Edited by:

Gordon Davies and Maria Helena Nazaré

Pages:

593-598

DOI:

10.4028/www.scientific.net/MSF.258-263.593

Citation:

R. Schwarz et al., "Performance Degradation of Microcrystalline Silicon-Based p-i-n Detectors Upon He4 Irradiation", Materials Science Forum, Vols. 258-263, pp. 593-598, 1997

Online since:

December 1997

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$35.00

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