Analysis of Reflectivity Measurements for GaN Films Grown on GaAs: Influence of Surface Roughness and Interface Layers

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Periodical:

Materials Science Forum (Volumes 264-268)

Edited by:

G. Pensl, H. Morkoç, B. Monemar and E. Janzén

Pages:

1347-1350

DOI:

10.4028/www.scientific.net/MSF.264-268.1347

Citation:

S. Shokhovets et al., "Analysis of Reflectivity Measurements for GaN Films Grown on GaAs: Influence of Surface Roughness and Interface Layers", Materials Science Forum, Vols. 264-268, pp. 1347-1350, 1998

Online since:

February 1998

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$35.00

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