X-Ray Section Topographic Investigation of the Growth Process of SiC Crystals

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Periodical:

Materials Science Forum (Volumes 264-268)

Edited by:

G. Pensl, H. Morkoç, B. Monemar and E. Janzén

Pages:

29-32

DOI:

10.4028/www.scientific.net/MSF.264-268.29

Citation:

S. Milita et al., "X-Ray Section Topographic Investigation of the Growth Process of SiC Crystals", Materials Science Forum, Vols. 264-268, pp. 29-32, 1998

Online since:

February 1998

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$35.00

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