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HomeMaterials Science ForumMaterials Science Forum Vols. 338-342MicroRaman and Hall Effect Study of n-Type Bulk...

MicroRaman and Hall Effect Study of n-Type Bulk 4H-SiC

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Silicon Carbide and Related Materials - 1999

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Periodical:

Materials Science Forum (Volumes 338-342)

Pages:

707-710

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.338-342.707

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Online since:

May 2000

Authors:

M. Chafai, J. Jiménez, Enric Martín, W.C. Mitchel, Adam W. Saxler, Ronald Perrin

Keywords:

4H Polytype, Hall, Phonons, Plasmon, RAMAN, Temperature Phonon Shift

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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