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HomeMaterials Science ForumMaterials Science Forum Vols. 338-342Digital X-Ray Imaging of SiC PVT Process: Analysis...

Digital X-Ray Imaging of SiC PVT Process: Analysis of Crystal Growth and Powder Source Degradation

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Silicon Carbide and Related Materials - 1999

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Periodical:

Materials Science Forum (Volumes 338-342)

Pages:

71-74

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.338-342.71

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Online since:

May 2000

Authors:

Peter J. Wellmann, Matthias Bickermann, Dieter Hofmann, L. Kadinski, M. Selder, Thomas L. Straubinger, Albrecht Winnacker

Keywords:

PVT Process, SiC Powder, X-Ray Imaging

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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