SiC Single Crystal Growth Rate Measurement by In-Situ Observation using the Transmission X-Ray Technique

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Periodical:

Materials Science Forum (Volumes 338-342)

Edited by:

Calvin H. Carter, Jr., Robert P. Devaty, and Gregory S. Rohrer

Pages:

75-78

DOI:

10.4028/www.scientific.net/MSF.338-342.75

Citation:

N. Oyanagi et al., "SiC Single Crystal Growth Rate Measurement by In-Situ Observation using the Transmission X-Ray Technique", Materials Science Forum, Vols. 338-342, pp. 75-78, 2000

Online since:

May 2000

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$35.00

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