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HomeMaterials Science ForumMaterials Science Forum Vols. 353-356Combined Scanning Tunneling Microscopy and...

Combined Scanning Tunneling Microscopy and Photoemission Studies of the β-SiC(100) c(4x2) Surface Reconstruction

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Silicon Carbide and Related Materials 2000

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Periodical:

Materials Science Forum (Volumes 353-356)

Pages:

235-238

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.353-356.235

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Online since:

January 2001

Authors:

V. Derycke, P. Fonteneau, V.Yu. Aristov, H. Enriquez, P. Soukiassian

Keywords:

Photoemission Spectroscopy, Scanning Tunneling Microscopy, Surface Reconstruction

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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