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HomeMaterials Science ForumMaterials Science Forum Vols. 353-356Intrinsic Defects in Silicon Carbide Polytypes

Intrinsic Defects in Silicon Carbide Polytypes

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Silicon Carbide and Related Materials 2000

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Periodical:

Materials Science Forum (Volumes 353-356)

Pages:

499-504

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.353-356.499

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Online since:

January 2001

Authors:

Nguyen Tien Son, P.N. Hai, Erik Janzén

Keywords:

Antisite, Electron Irradiation, Electron Paramagnetic Resonance (EPR), Vacancy

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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