GaN Thin Films on SiC Substrates Studied Using Variable Energy Positron Annihilation Spectroscopy

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Periodical:

Materials Science Forum (Volumes 363-365)

Edited by:

Werner Triftshäuser, Gottfried Kögel and Peter Sperr

Pages:

478-480

Citation:

Y.F. Hu et al., "GaN Thin Films on SiC Substrates Studied Using Variable Energy Positron Annihilation Spectroscopy", Materials Science Forum, Vols. 363-365, pp. 478-480, 2001

Online since:

April 2001

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