Investigation of Stacking Faults in Silicon by Induced Current Methods

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Periodical:

Materials Science Forum (Volumes 38-41)

Edited by:

G. Ferenczi

Pages:

1295-1300

DOI:

10.4028/www.scientific.net/MSF.38-41.1295

Citation:

A. Castaldini et al., "Investigation of Stacking Faults in Silicon by Induced Current Methods", Materials Science Forum, Vols. 38-41, pp. 1295-1300, 1989

Online since:

January 1991

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$35.00

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