Developement of a Scanning Minority Carrier Transient Spectroscopy Method: Application to the Study of Gold Diffusion in a Silicon Bicrystal

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Periodical:

Materials Science Forum (Volumes 38-41)

Edited by:

G. Ferenczi

Pages:

1325-1330

DOI:

10.4028/www.scientific.net/MSF.38-41.1325

Citation:

T. Heiser et al., "Developement of a Scanning Minority Carrier Transient Spectroscopy Method: Application to the Study of Gold Diffusion in a Silicon Bicrystal", Materials Science Forum, Vols. 38-41, pp. 1325-1330, 1989

Online since:

January 1991

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$35.00

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