Correlations between TD Annihilation and Oxygen Precipitation in Czochralski-Grown Silicon

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Periodical:

Materials Science Forum (Volumes 38-41)

Edited by:

G. Ferenczi

Pages:

643-648

Citation:

M. Reiche and J. Reichel, "Correlations between TD Annihilation and Oxygen Precipitation in Czochralski-Grown Silicon", Materials Science Forum, Vols. 38-41, pp. 643-648, 1989

Online since:

January 1991

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$38.00

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