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HomeMaterials Science ForumMaterials Science Forum Vols. 389-393Study of SiC PiN Diodes Subjected to High Current...

Study of SiC PiN Diodes Subjected to High Current Density Pulses

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Silicon Carbide and Related Materials 2001

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Periodical:

Materials Science Forum (Volumes 389-393)

Pages:

1269-1272

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.389-393.1269

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Online since:

April 2002

Authors:

Leonardo M. Hillkirk, Mietek Bakowski

Keywords:

Device Self-Heating, Device Simulation, Dynamic IV Characteristics, High Carrier Injection, IR Microscope, Power Diodes, Spatial Operator Algebra (SOA), Surge Current, Temperature Measurement

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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