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HomeMaterials Science ForumMaterials Science Forum Vols. 389-393Growth and Characterization of Three-Dimensional...

Growth and Characterization of Three-Dimensional SiC Nanostructures on Si

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Silicon Carbide and Related Materials 2001

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Periodical:

Materials Science Forum (Volumes 389-393)

Pages:

747-750

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.389-393.747

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Online since:

April 2002

Authors:

Volker Cimalla, Konstantinos Zekentes

Keywords:

Atomic Force Microscope (AFM), Grain Density, Islands, Nanostructure, Nucleation

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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