Electrical Properties and Interface Reaction of Annealed Cu/4H-SiC Schottky Rectifiers

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Periodical:

Materials Science Forum (Volumes 389-393)

Edited by:

S. Yoshida, S. Nishino, H. Harima and T. Kimoto

Pages:

925-928

Citation:

T. Hatayama et al., "Electrical Properties and Interface Reaction of Annealed Cu/4H-SiC Schottky Rectifiers", Materials Science Forum, Vols. 389-393, pp. 925-928, 2002

Online since:

April 2002

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