Volumes

Materials Science Forum
Vols. 423-425

Materials Science Forum
Vols. 419-422

Materials Science Forum
Vols. 416-418

Materials Science Forum
Vols. 414-415

Materials Science Forum
Vol. 413

Materials Science Forum
Vols. 408-412

Materials Science Forum
Vols. 404-407

Materials Science Forum
Vol. 403

Materials Science Forum
Vols. 396-402

Materials Science Forum
Vols. 394-395

Materials Science Forum
Vols. 389-393

Materials Science Forum
Vols. 386-388

Materials Science Forum
Vols. 384-385

HomeMaterials Science ForumMaterials Science Forum Vols. 404-407

Materials Science Forum Vols. 404-407

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.404-407

Export:

ToC:

Table of Contents

Paper Title Page

Localisation of Deformation and Internal Residual Stresses in Billets for Zr-Nb Pipe Rolling

Authors: Lev Zuev, S. Zavodchikov, B.S. Semukhin, B.S. Cheremnykh, V.A. Komissarov

647

Measurement of Residual Stress Through a Shot Peened Surface Subjected to Successive Material Removal

Authors: N.W. Bonner, Robert C. Wimpory, G.A. Webster, A. Tony Fry, F.A. Kandil

653

Round Robin Test on the Determination of Residual Stress Depth Distributions by X-ray Diffraction

Authors: Jens Gibmeier, Jian Lu, Berthold Scholtes

659

Behavior of Metallic Samples Subjected to External Stresses during Heating-Cooling Cycles

Authors: S. Battaglia, F. Mango

665

Yield Strength Determination of TiN Film by In-Situ XRD Stress Analysis Method

Authors: M. Qin, Vincent Ji, Jiu Hua Xu, J.B. Li, Ke Wei Xu, S.L. Ma

671

X-Ray Stress Measurements of TiCN Thin Films

Authors: Masahide Gotoh, Takayuki Murotani, Toshihiko Sasaki, Yukio Hirose

677

Residual Stresses in Decorative Electroplated Coatings

Authors: J.C.P. Pina, A. Morão Dias, Jean Lu Lebrun

683

Changes in Stress and Microstructure in Sputter Deposited Copper Films Due to Substrate Surface Effects

Authors: B. Okolo, P. Lamparter, U. Welzel, T. Wagner, Eric Jan Mittemeijer

691

Evaluation of Growth and Thermal Strains/Stresses in Epitaxial Thin Films Using X-Ray Diffraction

Authors: Jozef Keckes

697

X-Ray Measurements of TiN Film and Steel Substrate Subjected to External Loading

Authors: Keisuke Tanaka, Toshimasa Ito, Yoshiaki Akiniwa, Takahiro Ishii, Yasuhiro Miki

703