[1]
S. Nishino J.A. Powell and H.A. Will: Appl. Phys. Lett. 42 (1983), p.460.
Google Scholar
[2]
T.S. Zheleva, O-H Nam, M.D. Bremser and R.F. Davis: Appl. Phys. Lett. 71 (1997), p.2472.
Google Scholar
[3]
H. Marchand, J.P. Ibbetson, P.T. Fini, P. Kosodoy, S. Keller, S. denBaars, J.S. Speck, U.K. Mishira: Materials Internet Journal -Nitride Semiconductor Research 3 (1998), p.3.
Google Scholar
[4]
C. Jacob, M.H. Hong, J. Chung, P. Pirouz and S. Nishino: Materials Science Forum Vols. 338-342 (2000), p.249.
Google Scholar
[5]
S.E. Saddow, G.E. Carter, B. Geil, T. Zheleva, G. Melnychuck, M.E. Okhuysen, M.S. Mazzola, R.D. Vispute, M. Derenge, M. Ervin and K.A. Jones: Materials Science Forum Vols. 338-342 (2000), p.245.
DOI: 10.4028/www.scientific.net/msf.338-342.245
Google Scholar
[6]
Y. Okui, C. Jacob, S. Ohshima and S. Nishino: Materials Science Forum Vols. 389-393 (2002), P. 331.
Google Scholar
[7]
C. Jacob, P. Pirouz and S. Nishino: Mater. Sci. Forum Vols. 353-356 (2001), p.127.
Google Scholar