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HomeMaterials Science ForumMaterials Science Forum Vols. 433-436On the Unusual Nature of a DLTS-Detected Defect in...

On the Unusual Nature of a DLTS-Detected Defect in Bulk n-Type 6H-SiC

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Silicon Carbide and Related Materials - 2002

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Periodical:

Materials Science Forum (Volumes 433-436)

Pages:

383-386

DOI:

https://doi.org/10.4028/www.scientific.net/MSF.433-436.383

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Online since:

September 2003

Authors:

E. van Wyk, A.W.R. Leitch

Keywords:

DLTS, MIS Devices, Oxide Trap, Switching State

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© 2003 Trans Tech Publications Ltd. All Rights Reserved

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