Defect Reduction in SiC Crystals Grown by the Modified Lely Method

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Periodical:

Materials Science Forum (Volumes 433-436)

Edited by:

Peder Bergman and Erik Janzén

Pages:

83-86

DOI:

10.4028/www.scientific.net/MSF.433-436.83

Citation:

M. Anikin et al., "Defect Reduction in SiC Crystals Grown by the Modified Lely Method", Materials Science Forum, Vols. 433-436, pp. 83-86, 2003

Online since:

September 2003

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$35.00

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