European Powder Diffraction EPDIC 8

Volumes 443-444

doi: 10.4028/

Paper Title Page

Authors: Marek Andrzej Kojdecki

Abstract: A polycrystalline material may be considered as a set of crystallites. Since the crystallites have rather regular shapes, the...

Authors: Radomír Kužel, D. Šimek, J. Kub, Rinat K. Islamgaliev

Abstract: Two methods were used for the analysis of submicro-crystalline copper prepared by high-pressure (6 GPa) severe plastic deformation....

Authors: J. Lhotka, Radomír Kužel, G. Cappuccio, V. Valvoda

Abstract: The thickness measurement based on absorption of X-rays in thin films has been tested on a polycrystalline titanium nitride ...

Authors: I. Lucks, P. Lamparter, Jian Xu, Eric J. Mittemeijer

Abstract: Palladium powder was deformed by ball milling under an argon atmosphere in two types of mills for different milling times. Two methods ...

Authors: Juan Rodríquez-Carvajal, T. Roisnel

Abstract: A short account of the methodology used within FullProf to extract average micro-structural properties from the analysis of...

Authors: Arnold C. Vermeulen, Rob Delhez

Abstract: All methods of analyzing the broadening of XRD line profiles have to take into account two basic effects: broadening by the instrument...

Authors: U. Welzel, Eric J. Mittemeijer

Abstract: The so-called crystallite group (CGM) method, employed for diffraction stress analysis, involves that a possibly complex texture is...

Authors: Leszek Tarkowski, L. Laskosz, Jan T. Bonarski

Abstract: The traditionally applied registration method of the back-reflection pole figure is based on the equiangular measurement lattice. It...

Authors: I. Tomov

Abstract: A method of pole density measurements is described, which uses the differences in X-ray beam polarisation of two monochromators. The ...

Authors: H. Toraya, H. Hibino, Takashi Ida

Abstract: A quantitative basis for rocking curve measurements of preferentially oriented polycrystalline thin films is presented. The...


Showing 21 to 30 of 89 Paper Titles