European Powder Diffraction EPDIC 8

Volumes 443-444

doi: 10.4028/www.scientific.net/MSF.443-444

Paper Title Page

Authors: S. Battaglia, F. Mango

Abstract: Thermal expansion coefficients (TEC) of some metallic samples and rocks, along with one sample of amorphous silica, were determined ...

151
Authors: Kurt Erlacher, R. Görgl, Jozef Keckes, Hannes F. Jakob, L. Bruegemann, P. Doppler, A. Bergmann, Heinz Leitner, S. Marsoner, Peter Fratzl

Abstract: A laboratory system (NanoSTAR) based on a combination of specially designed X-ray multilayer optics (Göbel Mirrors) with optical...

155
Authors: Bonglea Kim, Boris Verman, Licai Jiang

Abstract: X-ray diffraction systems based on a microfocusing X-ray source and multilayer side-by-side optics are suitable for X-ray diffraction...

159
Authors: D. Šimek, Radomír Kužel, J. Kub, F. Kunc

Abstract: Textured thin film of PbTiO3 on glass and both textured and stressed films of TiB2 on iron substrate were investigated...

163
Authors: Boris Verman, Srivatsan Seshadri, Bonglea Kim

Abstract: A simple analytical approach is given to calculate the performance of parabolic mirrors for various wavelengths. Expressions are given for...

171
Authors: A. Zięba, W. Dąbrowski, P. Gryboś, W. Pawroźnik, J.R. Słowik, T. Stobiecki, K. Świentek, P. Wiącek

Abstract: Silicon strip detectors represent a new class of one-dimensional position-sensitive single photon counting devices. They allow a reduction...

175
Authors: Jan T. Bonarski

Abstract: Crystallographic texture is one of frequently investigated properties of near-surface regions. From the application point of view, the...

189
Authors: M. Hecker, N. Mattern, W. Brückner, C.M. Schneider

Abstract: The subject of the present investigation is the influence of annealing on the microstructure of Co thin films. In particular, the evolution...

193

Showing 31 to 40 of 89 Paper Titles