European Powder Diffraction EPDIC 8

Volumes 443-444

doi: 10.4028/

Paper Title Page

Authors: S. Battaglia, F. Mango

Abstract: Thermal expansion coefficients (TEC) of some metallic samples and rocks, along with one sample of amorphous silica, were determined ...

Authors: Kurt Erlacher, R. Görgl, Jozef Keckes, Hannes F. Jakob, L. Bruegemann, P. Doppler, A. Bergmann, Heinz Leitner, S. Marsoner, Peter Fratzl

Abstract: A laboratory system (NanoSTAR) based on a combination of specially designed X-ray multilayer optics (Göbel Mirrors) with optical...

Authors: Bonglea Kim, Boris Verman, Licai Jiang

Abstract: X-ray diffraction systems based on a microfocusing X-ray source and multilayer side-by-side optics are suitable for X-ray diffraction...

Authors: D. Šimek, Radomír Kužel, J. Kub, F. Kunc

Abstract: Textured thin film of PbTiO3 on glass and both textured and stressed films of TiB2 on iron substrate were investigated...

Authors: Boris Verman, Srivatsan Seshadri, Bonglea Kim

Abstract: A simple analytical approach is given to calculate the performance of parabolic mirrors for various wavelengths. Expressions are given for...

Authors: A. Zięba, W. Dąbrowski, P. Gryboś, W. Pawroźnik, J.R. Słowik, T. Stobiecki, K. Świentek, P. Wiącek

Abstract: Silicon strip detectors represent a new class of one-dimensional position-sensitive single photon counting devices. They allow a reduction...

Authors: Jan T. Bonarski

Abstract: Crystallographic texture is one of frequently investigated properties of near-surface regions. From the application point of view, the...

Authors: M. Hecker, N. Mattern, W. Brückner, C.M. Schneider

Abstract: The subject of the present investigation is the influence of annealing on the microstructure of Co thin films. In particular, the evolution...


Showing 31 to 40 of 89 Paper Titles